(Institute of Electrical and Electronics Engineers, 2019) Rao, G. Srinivasa; Raza, Muhammad Ali; Aslam, Muhammad; AL-Marshadi, Ali Hussein; Jun, Chi-Hyuck
This paper proposed a process capability index-based control chart under the new extended form of multiple-dependent state sampling (MDS) named generalized MDS (GMDS). The scheme is based on inner and outer control limits and utilizes the previous state of the samples. The performance comparisons of the proposed chart with the existing charts are made by using out-of-control ARL. The simulation study showed the superiority of the proposed chart over the existing PCI-based control charts under Shewhart and MDS schemes. An empirical illustration is also given to demonstrate the application of the proposed chart.