Estimation of stress-strength reliability from exponentiated Fréchet distribution

dc.contributor.authorRao, G. S
dc.contributor.authorRosaiah, K
dc.contributor.authorBabu, M. S
dc.date.accessioned2020-11-24T14:02:27Z
dc.date.available2020-11-24T14:02:27Z
dc.date.issued2016
dc.descriptionAbstract. Full text article is available at https://doi.org/10.1007/s00170-016-8404-zen_US
dc.description.abstractIn this paper, we are mainly concerned in estimating the reliability R = P(Y < X) in the exponentiated Fréchet distribution, recently proposed by Nadarajah and Kotz (2006), Acta Appl Math 92:97–111. The model arises as a generalization of the standard Fréchet distribution in the same way the exponentiated exponential distribution introduced by Gupta et al. (1998), Commun Stat Theory Methods 27:887–904. The maximum likelihood estimator and its asymptotic distribution are used to construct an asymptotic confidence interval of R. Assuming that the common scale and shape parameters are known, the maximum likelihood estimator, uniformly minimum variance unbiased estimator of R are discussed. Different methods and the corresponding confidence intervals are compared using Monte Carlo simulation. Using real data, we illustrate the procedure.en_US
dc.identifier.citationRao, G. S., Rosaiah, K., & Babu, M. S. (2016). Estimation of stress-strength reliability from exponentiated Fréchet distribution. The International Journal of Advanced Manufacturing Technology, 86(9-12), 3041-3049.en_US
dc.identifier.otherDOI: 10.1007/s00170-016-8404-z
dc.identifier.urihttp://hdl.handle.net/20.500.12661/2584
dc.language.isoenen_US
dc.publisherSpringeren_US
dc.subjectStress-strength modelen_US
dc.subjectSimulation studiesen_US
dc.subjectAsymptotic distributionsen_US
dc.subjectBootstrap confidence intervalsen_US
dc.subjectMaximum likelihood estimatoren_US
dc.subjectExponentiated fréchet distributionen_US
dc.subjectMonte carlo simulationen_US
dc.subjectUMVUEen_US
dc.titleEstimation of stress-strength reliability from exponentiated Fréchet distributionen_US
dc.typeArticleen_US
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