An economic reliability test plan for exponentiated half logistic distributed lifetimes
| dc.contributor.author | Naidu, Ramesh CH | |
| dc.contributor.author | Rao, Srinivasa G. | |
| dc.contributor.author | Rosaiah, K. | |
| dc.date.accessioned | 2020-11-24T13:57:38Z | |
| dc.date.available | 2020-11-24T13:57:38Z | |
| dc.date.issued | 2020 | |
| dc.description | Abstract. Full text article is available at http://dx.doi.org/10.22271/maths | en_US |
| dc.description.abstract | The exponentiated half logistic distribution introduced by Cordeiro et al. (2014) is a probability model for the life time of an item. A submitted lot will be accepted or rejected based on the sampling plans where items are to be tested and for collecting the life of items, these plans are called reliability test plans. The present reliability test plan is more desirable than similar plans exists in literature is entrenched with respect to termination time of the experiment. For a range of stated acceptance number we determine the minimum life test termination time, sample size, and producer’s risk. | en_US |
| dc.identifier.citation | Naidu, C. R., Rao, G. S., & Rosaiah, K. (2020). An economic reliability test plan for exponentiated half logistic distributed lifetimes. International Journal of Statistics and Applied Mathematics | en_US |
| dc.identifier.other | DOI: http://dx.doi.org/10.22271/maths | |
| dc.identifier.uri | http://hdl.handle.net/20.500.12661/2579 | |
| dc.language.iso | en | en_US |
| dc.publisher | International Journal of Statistics and Applied Mathematics | en_US |
| dc.subject | Economic reliability test | en_US |
| dc.subject | Log logistic | en_US |
| dc.subject | Log logistic distribution | en_US |
| dc.subject | Half logistic distribution | en_US |
| dc.subject | Producer’s risk, | en_US |
| dc.subject | Experimental time | en_US |
| dc.title | An economic reliability test plan for exponentiated half logistic distributed lifetimes | en_US |
| dc.type | Article | en_US |