Resubmitted lots with single sampling plans by attributes under the conditions of zero-inflated poisson distribution

dc.contributor.authorRao, Srinivasa G.
dc.contributor.authorAslam, Muhammad
dc.date.accessioned2020-12-10T06:55:01Z
dc.date.available2020-12-10T06:55:01Z
dc.date.issued2017
dc.descriptionAbstract. Full text article available at https://doi.org/10.1080/03610918.2015.1016236en_US
dc.description.abstractFor a well-monitored process, occurrence of nondefect is a frequent event sampling inspection. A suitable model for this situation is a zero-inflated Poisson (ZIP) distribution. In this manuscript, we will focus on the designing of a more flexible sampling plan called the resubmitted lots plan. The parameters of the proposed sampling plan are determined through the nonlinear optimization solution. The advantage of the proposed plan over the existing sampling in terms of average sample number is discussed. An example is given for the illustration purpose.en_US
dc.identifier.citationRao, G. S., & Aslam, M. (2017). Resubmitted lots with single sampling plans by attributes under the conditions of zero-inflated poisson distribution. Communications in Statistics-Simulation and Computation, 46(3), 1814-1824.en_US
dc.identifier.otherDOI:10.1080/03610918.2015.1016236
dc.identifier.urihttp://hdl.handle.net/20.500.12661/2643
dc.language.isoenen_US
dc.publisherTaylor and Francis Groupen_US
dc.subjectAcceptance samplingen_US
dc.subjectOperating characteristic functionen_US
dc.subjectResubmitted lotsen_US
dc.subjectSampling inspectionen_US
dc.subjectSingle samplingen_US
dc.subjectZero-inflated Poisson distributionen_US
dc.titleResubmitted lots with single sampling plans by attributes under the conditions of zero-inflated poisson distributionen_US
dc.typeArticleen_US
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