Bootstrap confidence intervals of CNpk for exponentiated Fréchet distribution

dc.contributor.authorGadde, S. R.
dc.contributor.authorRosaiah, K.
dc.contributor.authorMothukuri, S. B.
dc.date.accessioned2020-03-13T06:47:36Z
dc.date.available2020-03-13T06:47:36Z
dc.date.issued2019
dc.descriptionAbstract, Full text article is available at: https://doi.org/10.1007/s41872-018-0069-1en_US
dc.description.abstractConfidence intervals for process capability index using bootstrap method (Chen and Pearn, Qual Reliab Eng Int 13(6), 355–360, 1997) are constructed through simulation assuming that the underlying distribution is exponentiated Fréchet distribution (EFD). Parameters are estimated by Maximum likelihood (ML) method. Also obtain the estimated coverage probabilities and average widths of the bootstrap confidence intervals through Monte Carlo simulation. Illustrate the process capability indices for EFD using some numerical examples.en_US
dc.identifier.citationGadde, S. R., Rosaiah, K., & Mothukuri, S. B. (2019). Bootstrap confidence intervals of CNpk for exponentiated fréchet distribution. Life Cycle Reliability and Safety Engineering, 8(1), 33-41.en_US
dc.identifier.urihttp://hdl.handle.net/20.500.12661/2149
dc.language.isoenen_US
dc.publisherSpringer Natureen_US
dc.subjectExponentiated Fréchet distributionen_US
dc.subjectEFDen_US
dc.subjectProcess capability indexen_US
dc.subjectBootstrap confidence intervalen_US
dc.subjectMaximum likelihood estimationen_US
dc.subjectMonte Carlo simulationen_US
dc.subjectBoostrapen_US
dc.subjectCNpken_US
dc.titleBootstrap confidence intervals of CNpk for exponentiated Fréchet distributionen_US
dc.typeArticleen_US
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